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   晶片失效分析 →
IC Decapsulation
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IC Grinding:Positioned/None-positioned
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芯片开封
IC Decapsulation

開封, 即開蓋/開帽, 指去除ic封膠, 同時保持晶片功能的完整無損, 保持 die, bond pads, bond wires乃至lead-frame不受損傷, 為下一步晶片失效分析實驗做準備.

去封範圍

* 普通封裝

* COB、BGA

* 陶瓷、金屬等其他特殊封裝

 

 

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