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Failure Analysis Flow Chart
IC Micrography Flow Chart
FIB Application Flow Chart
 
P.Lab Services

IC Chemical Processing

Bare Die Extraction

De-Process / De-layer
* De-passivation
* De-Oxide
* De-Metal
* De-Poly
* De-Polyimide

P/N, Rom Code Staining

IC Micrography

FIB Application

Circuit Modification

Probing Pad Building

Cross-section


IC Failure Analysis

Decapsulation
De-encapsulation, De-Package

EMMI Application
Emission Microscope

OBIRCH
Optical Beam Induced Resistance Change

LC Application
Liquid Crystal Hot Spot

SEM Application
Scanning Electronic Microscope

Probing Test & Laser Cutting
Manual Probe Station & Laser Cutter

 

De-Gold Bump
Driver IC Gold Bump Removal

IC Grinding--
Positioned&Non-positioned
IC Metallographic Sample Preparation

EDX Application
Energy Dispersive X-Ray

X-Ray Application
X-Ray Nondestructive Test

SAM Application
Scanning Acoustic Microscope

ESD/Latch-up Test

ESD Test-Human Body Mode

ESD Test-Machine Mode

Latch-up Test

Semicon Equipment Agency

EVERBEING Probe Station
Manual Probe Station Made in Taiwan

ALLIED Metallographic Products
Equipment & Consumables for Metallographic Sample Preparation
Semicon Equipment Maintenance Service
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