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ESD Test
Latch-Up Test
 
ESD/Latch-up Test
ESD Test


As IC processing shrinks into the sub-micron region, ICs are becoming increasingly susceptible to electrostatic discharge damage. Failures caused by ESD are having increase effects on cost, reliability and final yield of ICs, and ESD's short becomes one of the top reasons that cause the failures in the electronic industry.

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Latch-Up Test

* Latch-up effect, also called SCR (Silicon Controlled Rectifier) effect, is an parasitic effect in CMOS technology.

* Latch-up effect can be called a new "CPU killer" besides electromigration effect.

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