* EMMI is a failure analysis tool of high efficiency, which can detect and locate very weak emmission（visible and near infrared）and capture many kinds of current leakage lights caused by device defects and abnormity.

* EMMI can detect device defects caused by ESD, Latch up, I/O Leakage, junction defect, hot electrons , oxide current leakage, etc.

* Leakage detecting ability of EMMI can reach to microampere level. While LC (Liquid Crystal) Hot Spot Detection only milliampere level.