Home
  IC Chemical Processing
  IC Failure Analysis
  FIB Application
  ESD/Latch-up Test
Equipment Angency
Semicon Equipment Maintenance Service
 
 
   芯片化学处理 →
Bare Die Extraction
Staining
晶片去層解剖
 
 
 
De-Process / De-layer & Micrography
Deprocess/Delayer & Micrography
晶片顯微拍照


點擊瀏覽大圖

  Copyright (c) 2006 Perfictlab.com. All rights reserved.